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SUMMARY:Non-destructive measurement of detailed transverse beam distributi
 on with the use of an ionization monitor
DTSTART;VALUE=DATE-TIME:20220715T141000Z
DTEND;VALUE=DATE-TIME:20220715T143000Z
DTSTAMP;VALUE=DATE-TIME:20260912T204832Z
UID:indico-contribution-530@events.sinp.msu.ru
DESCRIPTION:Speakers: Konstantin Timoshenko (JINR)\nThe constant monitorin
 g of the uniformity of the density distribution of the flux of the acceler
 ated particles is required in various applied fields as such as the studie
 s of biological objects and of radiation resistance of electronic devices.
  The ionization monitor has been developed at FLNR JINR in order to make t
 he non-destructive detailed high precision measurement of the transverse p
 rofile of a wide beam of accelerated particles. The monitor design is aime
 d at measuring the concentration of residual gas ions arising along on the
  beam path. The distribution of the ions is proportional to the distributi
 on of the particle flux density. The ions are extracted from the beam regi
 on by a constant electric field larger than 0.2 kV/cm and then are acceler
 ated by a sawtooth voltage with a frequency of 2 Hz. During the extraction
  the ions get the kinetic energy proportional to the distance traveled in 
 a constant field and to the value of the subsequent accelerating voltage. 
 The extracted ions enter two consecutive electrostatic analyzers separated
  by a plate with 1 mm slit. Ions can enter the second analyzer through thi
 s slit only if they were created in a narrow beam region\, which position 
 depends on the value of the sawtooth voltage. The monitor sensitivity is i
 ncreased by MCP (Micro channel plate) placed after the analyzers. The coll
 ector divided into 31 strips is located after the MCP. The current from th
 e strips is digitized by several ADC (Analog to digital converter) channel
 s. The first coordinate of the ion formation position is determined by the
  number of the collector strip. The second coordinated is extracted from t
 he value of the sawtooth voltage measured by another ADC. The number of em
 ployed ADCs allows every second measurement of a detailed two-dimensional 
 distribution with 31x31 points on a beam cross section up to 45 mm in diam
 eter. Because the ions of the residual gas are collected from the beam pat
 h 90 mm long\, the sensitivity of the monitor is almost two orders of magn
 itude higher than the existing analogs [1\, 2]. The monitor can also be us
 ed to measure the profile of secondary beams.\n\nhttps://events.sinp.msu.r
 u/event/8/contributions/530/
LOCATION: Физический ф-т\, ауд. 5-42
URL:https://events.sinp.msu.ru/event/8/contributions/530/
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